The physics of SiO₂ and its interfaces : proceedings of the International Topical Conference on the Physics of Si0₂ and Its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978 / editor, Sokrates T. Pantelides.
By: International Topical Conference on the Physics of SiO₂ and Its Interfaces (1978 : Yorktown Heights, N.Y.)
Contributor(s): Pantelides, Sokrates T
Language: English Publisher: New York : Pergamon Press, c1978Description: xi, 488 pages : illustrations ; 27 cmContent type: text Media type: unmediated Carrier type: volumeISBN: 0080230490; 9780080230498Subject(s): Silica -- Congresses | Surfaces (Physics) -- Congresses | Surface chemistry -- CongressesDDC classification: 546/.683/2 LOC classification: QC585.75.S55 | I57 1978| Item type | Current location | Home library | Call number | Status | Date due | Barcode | Item holds |
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BOOK
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COLLEGE LIBRARY | COLLEGE LIBRARY SUBJECT REFERENCE | 546/.683/2 P941 1978 (Browse shelf) | Available | CITU-CL-20271 |
Total holds: 0
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Includes bibliographical references and index.
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