The physics of SiO₂ and its interfaces : proceedings of the International Topical Conference on the Physics of Si0₂ and Its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978 / editor, Sokrates T. Pantelides. - xi, 488 pages : illustrations ; 27 cm.

Includes bibliographical references and index.

0080230490 9780080230498

78018205


Silica--Congresses.
Surfaces (Physics)--Congresses.
Surface chemistry--Congresses.

QC585.75.S55 / I57 1978

546/.683/2