Reliability and degradation : semiconductor devices and circuits / edited by M.J. Howes, D.V. Morgan.
Contributor(s): Howes, M. J | Morgan, D. V
Language: English Series: The Wiley series in solid state devices and circuitsPublisher: Chichester : J. Wiley, c1981Description: xii, 444 pages : illustrations ; 24 cmContent type: text Media type: unmediated Carrier type: volumeISBN: 0471280283; 9780471280286Subject(s): Semiconductors -- ReliabilityDDC classification: 621.3815/2 LOC classification: TK7871.85 | .R44 1981| Item type | Current location | Home library | Call number | Status | Date due | Barcode | Item holds |
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COLLEGE LIBRARY | COLLEGE LIBRARY SUBJECT REFERENCE | 621.3815/2 R279 1981 (Browse shelf) | Available | CITU-CL- 13553 |
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| 621.3813360 C165 1985 Understanding solid state electronics / | 621.3813360 H119 1972 Understanding solid state electronics / | 621.3815/2 B735 1988 Experiments in gallium arsenide technology / | 621.3815/2 R279 1981 Reliability and degradation : semiconductor devices and circuits / | 621.3815/28 K658 1972a Transistor and integrated electronics / | 621.3815/3 C767 1986 Contemporary electronics circuits deskbook / | 621.3815/37 M317 Digital design / |
Includes bibliographical references and index.
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