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Reliability and degradation : semiconductor devices and circuits / edited by M.J. Howes, D.V. Morgan. - xii, 444 pages : illustrations ; 24 cm. - The Wiley series in solid state devices and circuits .

Includes bibliographical references and index.

ISBN: 0471280283 9780471280286

LCCN: 80042310

Nat. Bib. No.: GB***

Subjects--Topical Terms:
Semiconductors--Reliability.

LC Class. No.: TK7871.85 / .R44 1981

Dewey Class. No.: 621.3815/2