000			01439cam a2200361 i 4500
999			_c95114 _d95114
001			847996
003			CITU
005			20260319100356.0
008			260319b ||||| |||| 00| 0 eng d
010			_a 78018205
020			_a0080230490
020			_a9780080230498
035			_a847996
040			_aCITU LRAC _cDLC _dDLC _beng
041			_aeng
050	0	0	_aQC585.75.S55 _bI57 1978
082	0	0	_a546/.683/2
111	2		_aInternational Topical Conference on the Physics of SiO₂ and Its Interfaces _d(1978 : _cYorktown Heights, N.Y.)
245	1	4	_aThe physics of SiO₂ and its interfaces : _bproceedings of the International Topical Conference on the Physics of Si0₂ and Its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978 / _ceditor, Sokrates T. Pantelides.
264		1	_aNew York : _bPergamon Press, _cc1978.
300			_axi, 488 pages : _billustrations ; _c27 cm.
336			_atext _btxt _2rdacontent
337			_aunmediated _bn _2rdamedia
338			_avolume _bnc _2rdacarrier
504			_aIncludes bibliographical references and index.
650		0	_aSilica _xCongresses.
650		0	_aSurfaces (Physics) _xCongresses.
650		0	_aSurface chemistry _xCongresses.
700	1		_aPantelides, Sokrates T.
906			_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg
942			_2ddc _cBK