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_a9781394229451 _qelectronic book |
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_a1394229453 _qelectronic book |
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_a10.1002/9781394229451 _2doi |
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| 035 | _a(OCoLC)1391129337 | ||
| 035 | 9 | _a(OCLCCM-Owned)1391129337 | |
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| 041 | _aeng. | ||
| 049 | _aMAIN | ||
| 050 | 4 |
_aTK7871.99.O74 _bN48 2023 |
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| 082 | 0 | 0 |
_223 _a621.381 |
| 100 | 1 |
_aNguyen, Thien-Phap, _eauthor. |
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| 245 | 1 | 0 |
_aDefects in organic semiconductors and devices / _cThien-Phap Nguyen. |
| 264 | 1 |
_aLondon, UK : _bISTE Ltd ; _aHoboken, NJ : _bJohn Wiley & Sons, Inc., _c2023. |
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| 264 | 4 | _c©2023 | |
| 300 | _a1 online resource. | ||
| 336 |
_atext _btxt _2rdacontent |
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_acomputer _bc _2rdamedia |
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| 338 |
_aonline resource _bcr _2rdacarrier |
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| 490 | 1 | _aElectronics engineering series | |
| 505 | 0 | _aTable of Contents Abbreviations ix Introduction xvii Chapter 1. Overview of Organic Semiconductors 1 1.1. Organic semiconductors 2 1.2. Doping of organic semiconductors 4 1.3. Organic electronic devices 6 1.3.1. Architectures of organic devices 6 1.3.2. Organic light-emitting diodes (OLEDs) 11 1.3.3. Organic solar cells (OSCs or OPVs) 13 1.3.4. Organic field-effect transistors (OFETs) 15 Chapter 2. Defects in Materials 19 2.1. Order and disorder 19 2.2. Crystalline semiconductors 20 2.2.1. Localized states 21 2.2.2. Density of states (DOS) 22 2.3. Amorphous semiconductors 22 2.3.1. Localized states 23 2.3.2. Density of states (DOS) 24 2.4. Organic semiconductors 25 2.4.1. Polymer structure 26 2.4.2. Polymer crystallinity 27 2.4.3. Defects in conjugated polymers 28 2.4.4. Defects in small-molecule crystals 29 2.4.5. Localized states 30 2.4.6. Density of states 31 2.5. Distribution of the energetic states 32 Chapter 3. Defects and Physical Properties of Semiconductors 35 3.1. Carrier transport in organic semiconductors 35 3.1.1. Hopping conduction 37 3.1.2. Uniform density of states model 38 3.1.3. Non-uniform density of states models 39 3.2. Effects of defects on the carrier transport 44 3.2.1. Traps and recombination centers 44 3.2.2. Trapping mechanisms and trap parameters 46 3.3. Optical properties of semiconductors and defects 56 3.3.1. Defects and absorption 56 3.3.2. Defects and luminescence 59 Chapter 4. Techniques for Studying Defects in Semiconductors 65 4.1. Electron spin resonance (ESR) 65 4.1.1. Basic concepts of ESR 66 4.1.2. Interpretation of ESR line 67 4.1.3. Electron nuclear double resonance (ENDOR) 68 4.1.4. Investigation of defects using the ESR technique 69 4.2. Optical techniques 72 4.2.1. Fluorescence spectroscopy (FL) 72 4.2.2. Thermally stimulated luminescence (TSL) spectroscopy 75 4.3. Electrical techniques 86 4.3.1. Thermally stimulated current (TSC) technique 87 4.3.2. Current-voltage measurements: space charge-limited current (SCLC) 96 4.3.3. Impedance spectroscopy (IS) 110 4.3.4. Deep-level transient spectroscopy (DLTS) 134 4.3.5. Time of flight (TOF) and charge carrier extraction by linearly increasing voltage (CELIV) techniques 152 Chapter 5. Defect Origins 159 5.1. Defects in organic semiconductors 159 5.1.1. Structural defects 160 5.1.2. Impurity defects 160 5.2. Defects in organic devices 162 5.2.1. Defects from the semiconductor 163 5.2.2. Defects from the surface and the interface 164 5.2.3. Defects from diffused impurities 168 Chapter 6. Defects, Performance and Reliability of Organic Devices 173 6.1. Impact of defects on the performance of organic devices 174 6.1.1. Defects and efficiency of OLEDs 174 6.1.2. Defects and efficiency of OPVs 176 6.1.3. Defects and performance of OFETs 181 6.2. Impact of defects on the stability of organic devices 183 6.2.1. Overview of degradation mechanisms in organic semiconductors and devices 184 6.2.2. Defects and degradation of organic semiconductor and devices 188 Future Prospects 217 References 223 Index 249 | |
| 520 | _aDefects in Organic Semiconductors and Devices introduces the fundamental aspects of defects in organic semiconductors and devices in relation to the structure of materials and architecture of electronic components. It covers the topics of defect formation and evolution, defect measurement techniques and their adaption to organic devices, the effects of defects on the physical properties of materials and their effects on the performance and lifetime of organic devices. Identifying defects and determining their characteristics in the structure of organic devices such as OLEDs, OFETs and OPVs make it possible to better understand degradation processes and develop solutions to improve the reliability of such devices. | ||
| 545 | 0 | _aAbout the Author Thien-Phap Nguyen is Emeritus Professor at Nantes University, France. He has taught solid state physics, semiconductor physics and organic electronics. His research focuses on physical processes in organic semiconductors and devices. | |
| 588 | _aDescription based on online resource; title from digital title page (viewed on August 18, 2023). | ||
| 650 | 0 | _aElectronics. | |
| 650 | 0 |
_aOrganic semiconductors. _0http://id.loc.gov/authorities/subjects/sh85095510 |
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| 655 | 0 | _aElectronic books. | |
| 830 | 0 |
_aElectronics engineering series (London, England) _0http://id.loc.gov/authorities/names/no2013108057 |
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| 856 | 4 | 0 |
_uhttps://onlinelibrary.wiley.com/doi/book/10.1002/9781394229451 _yFull text is available at Wiley Online Library. Click here to view |
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