| 000 | 01169cam a2200361 a 4500 | ||
|---|---|---|---|
| 999 |
_c94205 _d94205 |
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| 001 | 3718355 | ||
| 003 | CITU | ||
| 005 | 20260209175618.0 | ||
| 008 | 260209b ||||| |||| 00| 0 eng d | ||
| 010 | _a 80042310 | ||
| 015 | _aGB*** | ||
| 020 | _a0471280283 | ||
| 020 | _a9780471280286 | ||
| 035 | _a3718355 | ||
| 040 |
_aCITU LRAC _cDLC _dDLC _beng |
||
| 041 | _aeng | ||
| 050 | 0 | 0 |
_aTK7871.85 _b.R44 1981 |
| 082 | 0 | 0 |
_a621.3815/2 _219 |
| 245 | 0 | 0 |
_aReliability and degradation : _bsemiconductor devices and circuits / _cedited by M.J. Howes, D.V. Morgan. |
| 264 | 1 |
_aChichester : _bJ. Wiley, _cc1981. |
|
| 300 |
_axii, 444 pages : _billustrations ; _c24 cm. |
||
| 336 |
_atext _btxt _2rdacontent |
||
| 337 |
_aunmediated _bn _2rdamedia |
||
| 338 |
_avolume _bnc _2rdacarrier |
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| 440 | 4 | _aThe Wiley series in solid state devices and circuits | |
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aSemiconductors _xReliability. |
|
| 700 | 1 | _aHowes, M. J. | |
| 700 | 1 | _aMorgan, D. V. | |
| 906 |
_a7 _bcbc _corignew _d2 _eocip _f19 _gy-gencatlg |
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| 942 |
_2ddc _cBK |
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