| 000 | 00915cam a2200301 i 4500 | ||
|---|---|---|---|
| 999 |
_c89225 _d89225 |
||
| 001 | 3208443 | ||
| 003 | CITU | ||
| 005 | 20241127091321.0 | ||
| 008 | 780516s1978 nyua b 001 0 eng | ||
| 010 | _a 78000206 | ||
| 020 | _a0122413601 | ||
| 040 |
_aCITU LRAC _cDLC _dDLC _beng |
||
| 041 | _aeng | ||
| 050 | 0 | 0 |
_aTA418.7 _b.S67 |
| 082 | 0 | 0 | _a621.36 |
| 245 | 0 | 0 |
_aSpeckle metrology / _cedited by Robert K. Erf. |
| 264 | 1 |
_aNew York : _bAcademic Press, _c1978. |
|
| 300 |
_axiv, 331 pages : _billustrations ; _c24 cm. |
||
| 336 |
_2rdacontent _atext _btxt |
||
| 337 |
_2rdamedia _aunmediated _bn |
||
| 338 |
_2rdacarrier _avolume _bnc |
||
| 440 | 0 | _aQuantum electronics--principles and applications | |
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 | _aSpeckle metrology. | |
| 700 | 1 | _aErf, Robert K. | |
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
||
| 942 |
_2ddc _cBK |
||