000			04792nam a22003497a 4500
999			_c78422 _d78422
003			CITU
005			20230213084725.0
007			cr an aaaaa
008			211020b ||||| |||| 00| 0 eng d
020			_a9781119620587
020			_a9781119620600
041			_aeng
082	0	0	_a004.6
100	1		_4Goyal, Neeraj Kumar. _eauthor
245			_aInterconnection network reliability evaluation : _bmultistage layouts / _cNeeraj Kumar Goyal, S. Rajkumar.
264		1	_aHoboken, NJ : _bJohn Wiley & Sons, Inc., _c2020.
264		1	_aBeverly, MA : _bScrivener Publishing LLC, _c2020.
300			_a1 online resource (240 pages) :
336			_2rdacontent _atext _btxt
337			_2rdamedia _acomputer _bc
338			_2rdacarrier _aonline resource _bcr
500			_aDr. Neeraj Kumar Goyal is currently an Associate Professor in Subir Chowdhury School of Quality and Reliability, Indian Institute of Technology (IIT), Kharagpur, India. He received his PhD degree from IIT Kharagpur in reliability engineering in 2006.His areas of research and teaching are network reliability, software reliability, electronic system reliability, reliability testing, probabilistic risk/safety assessment, and reliability design. He has completed various research and consultancy projects for various organizations, e.g. DRDO, NPCIL, Vodafone, and ECIL. He has contributed several research papers to various international journals and conference proceedings. Dr. S. Rajkumar received his BE (Distinction) and ME (Distinction) degrees from Anna University, India, in 2009 and 2011, respectively. He obtained his PhD from the Indian Institute of Technology Kharagpur, India in 2017. Currently working as an Assistant Professor in Department of ECE at Adama Science and Technology University (ASTU), Ethiopia. His research interests include reliability engineering and interconnection networks. He has contributed notable research papers to international journals.
504			_aIncludes bibliographical references and index.
505	0		_aTable of Contents Export Citation(s) Free Access Front Matter (Pages: i-xiv) Summary PDF Request permissions CHAPTER 1 Introduction (Pages: 1-10) Summary PDF Request permissions CHAPTER 2 Interconnection Networks (Pages: 11-61) Summary PDF Request permissions CHAPTER 3 MIN Reliability Evaluation Techniques (Pages: 63-83) Summary PDF Request permissions CHAPTER 4 Terminal Reliability Analysis of MIN Layouts (Pages: 85-113) Summary PDF Request permissions CHAPTER 5 Comprehensive MIN Reliability Paradigms Evaluation (Pages: 115-156) Summary PDF Request permissions CHAPTER 6 Dynamic Tolerant and Reliable Four Disjoint MIN Layouts (Pages: 157-201) Summary PDF Request permissions Free Access References (Pages: 203-211) First Page PDF References Request permissions Free Access Index (Pages: 213-214) PDF Request permissions Free Access Also of Interest (Pages: b1-b2) PDF Request permissions
520			_a"In recent years, human beings have become largely dependent on communication networks, such as computer communication networks, telecommunication networks, mobile switching networks etc., for their day-to-day activities. In today's world, humans and critical machines depend on these communication networks to work properly. Failure of these communication networks can result in situations where people may find themselves isolated, helpless and exposed to hazards. It is fact that every component or system can fail and its failure probability increases with size and complexity. Therefore, it is essential to compute and assure the reliability of these networks, which are growing and becoming complex. Reliability modeling and computation is necessary for reliability and safety assurance of these networks. It also helps to identify weak links. These weak links can be improved cost effectively using reliability design techniques. Recent developments in communication hardware industry has resulted in increasingly reliable and non-repairable (need to be replaced when got bad) network components. However, new designs involve new components, which tend to be less reliable. A good network design involving fault tolerance and redundancies can deliver better system reliability at lesser cost. This allows new designs to be released faster and works reliably even when components are not mature enough from reliability point of view."-- Provided by publisher.
650		0	_aComputer networks _xReliability.
650		0	_aComputer networks _xEvaluation.
655		0	_aElectronic books.
700	1		_aRajkumar, S. _eauthor
856			_yFull text available at Wiley Online Library Click here to view _uhttps://onlinelibrary.wiley.com/doi/book/10.1002/9781119620600
942			_2ddc _cER