000 | 01004nam a22003017a 4500 | ||
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999 |
_c76800 _d76800 |
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003 | CITU | ||
005 | 20211002135903.0 | ||
008 | 211002b ||||| |||| 00| 0 eng d | ||
010 | _a87081303 | ||
020 | _a0070095221 | ||
040 |
_aCITU LRAC _ceng |
||
050 | 0 | 0 |
_aTK7878.4 _b.B48 1987 |
082 | 0 | 0 |
_a621.381 _219 |
100 | 1 |
_aByers, T. J. _eauthor |
|
245 | 1 | 0 |
_aElectronic test equipment : _btheory and applications / _cT.J. Byers. |
264 | 1 |
_aNew York, N.Y. : _bIntertext Publications : _bMcGraw-Hill Book Co., _cc1987. |
|
300 |
_axii, 335 pages : _billustrations; _c24 cm. |
||
336 |
_atext _btxt _2rdacontent |
||
337 |
_aunmediated _bn _2rdamedia |
||
338 |
_avolume _bnc _2rdacarrier |
||
500 | _aCover title: Electronic test equipment : principles and applications. | ||
500 | _aIncludes index. | ||
504 | _aBibliography: p. 315-317. | ||
650 | 0 | _aElectronic instruments. | |
650 | 0 | _aElectronic measurements. | |
942 |
_2ddc _cBK |