| 000 | 01660cam a2200397 a 4500 | ||
|---|---|---|---|
| 999 |
_c52893 _d52893 |
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| 001 | 14966937 | ||
| 003 | CITU | ||
| 005 | 20240628103251.0 | ||
| 008 | 070814s2008 njua b 001 0 eng | ||
| 010 | _a 2007033849 | ||
| 020 | _a9780132209106 (hardcover : alk. paper) | ||
| 020 | _a0132209101 (hardcover : alk. paper) | ||
| 035 | _a(OCoLC)ocn154806632 | ||
| 035 | _a(OCoLC)154806632 | ||
| 040 |
_aCITU LRAC _cDLC _dBTCTA _dBAKER _dYDXCP _dC#P _dDLC _beng |
||
| 041 | _aeng | ||
| 050 | 0 | 0 |
_aTK5103.7 _b.D532 2008 |
| 082 | 0 | 0 |
_a621.382 _222 |
| 245 | 0 | 0 |
_aDigital communications test and measurement : _bhigh-speed physical layer characterization / _cDennis Derickson and Marcus Müller, editors. |
| 264 | 1 |
_aUpper Saddle River, NJ : _bPrentice Hall, _cc2008. |
|
| 300 |
_axxxiii, 935 pages : _billustrations ; _c25 cm. |
||
| 336 |
_2rdacontent _atext _btxt |
||
| 337 |
_2rdamedia _aunmediated _bn |
||
| 338 |
_2rdacarrier _avolume _bnc |
||
| 490 | 1 | _aPrentice Hall modern semiconductor design series | |
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aDigital communications _xMeasurement. |
|
| 650 | 0 | _aSignal integrity (Electronics) | |
| 700 | 1 | _aDerickson, Dennis. | |
| 700 | 1 | _aMuller, Marcus. | |
| 830 | 0 |
_aPrentice Hall modern semiconductor design series. _pPrentice Hall signal integrity library. |
|
| 856 | 4 | 1 |
_3Table of contents only _uhttp://www.loc.gov/catdir/toc/ecip0725/2007033849.html |
| 906 |
_a7 _bcbc _corignew _d1 _eecip _f20 _gy-gencatlg |
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| 942 |
_2ddc _cBK |
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