TY  - BOOK
AU  - Howes,M.J.
AU  - Morgan,D.V.
TI  - Reliability and degradation: semiconductor devices and circuits 
SN  - 0471280283
AV  - TK7871.85 .R44 1981
U1  - 621.3815/2 19
PY  - 1981///
CY  - Chichester
PB  - J. Wiley
KW  - Semiconductors
KW  - Reliability
N1  - Includes bibliographical references and index
ER  -