Reliability and degradation :  semiconductor devices and circuits / 
edited by M.J. Howes, D.V. Morgan. 
 - xii, 444 pages :  illustrations ;  24 cm. 
 - The Wiley series in solid state devices and circuits .
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>0471280283 9780471280286 
<br/><br/><label>LCCN: </label>80042310  
<br/><br/><label>Nat. Bib. No.: </label>GB*** 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Reliability.
<br/><br/><label>LC Class. No.: </label>TK7871.85  / .R44 1981 
<br/><br/><label>Dewey Class. No.: </label>621.3815/2