TY  - BOOK
AU  - 
AU  - Rajkumar,S.
TI  - Interconnection network reliability evaluation :  : multistage layouts 
SN  - 9781119620587 
U1  - 004.6 
PY  - 2020///
CY  - Hoboken, NJ : 
PB  - John Wiley & Sons, Inc.
KW  - Computer networks
KW  - Reliability.
KW  - Evaluation
KW  - Electronic books
N1  - Dr. Neeraj Kumar Goyal is currently an Associate Professor in Subir Chowdhury School of Quality and Reliability, Indian Institute of Technology (IIT), Kharagpur, India. He received his PhD degree from IIT Kharagpur in reliability engineering in 2006.His areas of research and teaching are network reliability, software reliability, electronic system reliability, reliability testing, probabilistic risk/safety assessment, and reliability design. He has completed various research and consultancy projects for various organizations, e.g. DRDO, NPCIL, Vodafone, and ECIL. He has contributed several research papers to various international journals and conference proceedings.

Dr. S. Rajkumar received his BE (Distinction) and ME (Distinction) degrees from Anna University, India, in 2009 and 2011, respectively. He obtained his PhD from the Indian Institute of Technology Kharagpur, India in 2017. Currently working as an Assistant Professor in Department of ECE at Adama Science and Technology University (ASTU), Ethiopia. His research interests include reliability engineering and interconnection networks. He has contributed notable research papers to international journals.

; Includes bibliographical references and index; Table of Contents
Export Citation(s)
Free Access
Front Matter (Pages: i-xiv)
Summary
PDF
Request permissions
CHAPTER 1
Introduction (Pages: 1-10)
Summary
PDF
Request permissions
CHAPTER 2
Interconnection Networks (Pages: 11-61)
Summary
PDF
Request permissions
CHAPTER 3
MIN Reliability Evaluation Techniques (Pages: 63-83)
Summary
PDF
Request permissions
CHAPTER 4
Terminal Reliability Analysis of MIN Layouts (Pages: 85-113)
Summary
PDF
Request permissions
CHAPTER 5
Comprehensive MIN Reliability Paradigms Evaluation (Pages: 115-156)
Summary
PDF
Request permissions
CHAPTER 6
Dynamic Tolerant and Reliable Four Disjoint MIN Layouts (Pages: 157-201)
Summary
PDF
Request permissions
Free Access
References (Pages: 203-211)
First Page
PDF
References
Request permissions
Free Access
Index (Pages: 213-214)
PDF
Request permissions
Free Access
Also of Interest (Pages: b1-b2)
PDF
Request permissions
N2  - "In recent years, human beings have become largely dependent on communication networks, such as computer communication networks, telecommunication networks, mobile switching networks etc., for their day-to-day activities. In today's world, humans and critical machines depend on these communication networks to work properly. Failure of these communication networks can result in situations where people may find themselves isolated, helpless and exposed to hazards. It is fact that every component or system can fail and its failure probability increases with size and complexity. Therefore, it is essential to compute and assure the reliability of these networks, which are growing and becoming complex. Reliability modeling and computation is necessary for reliability and safety assurance of these networks. It also helps to identify weak links. These weak links can be improved cost effectively using reliability design techniques. Recent developments in communication hardware industry has resulted in increasingly reliable and non-repairable (need to be replaced when got bad) network components. However, new designs involve new components, which tend to be less reliable. A good network design involving fault tolerance and redundancies can deliver better system reliability at lesser cost. This allows new designs to be released faster and works reliably even when components are not mature enough from reliability point of view."-- Provided by publisher
UR  - https://onlinelibrary.wiley.com/doi/book/10.1002/9781119620600
ER  -