Speckle metrology / edited by Robert K. Erf.
Contributor(s): Erf, Robert K
Language: English Series: Quantum electronics--principles and applicationsPublisher: New York : Academic Press, 1978Description: xiv, 331 pages : illustrations ; 24 cmContent type: text Media type: unmediated Carrier type: volume ISBN: 0122413601Subject(s): Speckle metrologyDDC classification: 621.36 LOC classification: TA418.7 | .S67| Item type | Current location | Home library | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
BOOK
|
COLLEGE LIBRARY | COLLEGE LIBRARY SUBJECT REFERENCE | 621.36 Sp31 1978 (Browse shelf) | Available | CITU-CL-19805 |
Total holds: 0
Browsing COLLEGE LIBRARY Shelves , Shelving location: SUBJECT REFERENCE Close shelf browser
|
|
|
|
|
No cover image available |
|
||
| 621.36 F914 2004 Photonics rules of thumb : optics, electro-optics, fiber optics, and lasers / | 621.36 K131 1990 Group-theoretical methods in image understanding / | 621.36 R279 1998 Reliability of photonics materials and structures : symposium held April 13-16, 1998, San Francisco, California, U.S.A. / | 621.36 Sp31 1978 Speckle metrology / | 621.36 V553 2002 Interactive exploration of visual content / | 621.362 K945 1962 Elements of infrared technology: generation, transmission, and detection / | 621.366 B21 1995 Lasers: the perioperative challenge/ |
Includes bibliographical references and index.
There are no comments for this item.