Product maturity. (Record no. 88486)

000 -LEADER
fixed length control field 07281nam a22004337a 4500
003 - CONTROL NUMBER IDENTIFIER
control field CITU
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20240912085153.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS--GENERAL INFORMATION
fixed length control field m o d
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr cnu|||unuuu
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 240912b |||||o|||| 00| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781786307392
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781119902232
Qualifying information (electronic bk. : oBook)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 1119902231
Qualifying information (electronic bk. : oBook)
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1002/9781119902232
Source of number or code doi
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)1305060023
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TA169
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 620/.00452
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Preferred name for the person Bayle, Franck,
Authority record control number http://id.loc.gov/authorities/names/no2019080205
Relator term author.
245 10 - TITLE STATEMENT
Title Product maturity.
Number of part/section of a work 1,
Name of part/section of a work Theoretical principals and industrial applications /
Statement of responsibility, etc Franck Bayle.
246 30 - VARYING FORM OF TITLE
Title proper/short title Theoretical principals and industrial applications.
264 #1 - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc London, UK :
Name of publisher, distributor, etc ISTE, Ltd. ;
Place of publication, distribution, etc Hoboken, NJ :
Name of publisher, distributor, etc Wiley,
Date of publication, distribution, etc 2022.
300 ## - PHYSICAL DESCRIPTION
Extent 1 online resource.
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent.
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia.
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier.
340 ## - PHYSICAL MEDIUM
Source rdacc
Authority record control number or standard number http://rdaregistry.info/termList/RDAColourContent/1003.
490 1# - SERIES STATEMENT
Series statement Mechanical engineering and solid mechanics series. Reliability of multiphysical systems set ;
Volume number/sequential designation volume 12.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc Includes bibliographical references and index.
505 0# - CONTENTS
Formatted contents note Table of Contents<br/><br/>Foreword by Laurent Denis ix<br/><br/>Foreword by Serge Zaninotti xiii<br/><br/>Acknowledgements xv<br/><br/>Introduction xvii<br/><br/>Chapter 1. Reliability Review 1<br/><br/>1.1. Failure rate 1<br/><br/>1.2. Temperature effect 6<br/><br/>1.3. Effect of maintenance 6<br/><br/>1.4. MTBF 7<br/><br/>1.5. Nature of the reliability objective 9<br/><br/>Chapter 2. Maturity 11<br/>Serge ZANINOTTI<br/><br/>2.1. Context 11<br/><br/>2.2. Normative context and its implications 13<br/><br/>2.2.1. Quality standards 13<br/><br/>2.2.2. Quality management system and product quality 13<br/><br/>2.2.3. Product quality and dependability 16<br/><br/>2.2.4. Product dependability and maturity 18<br/><br/>2.2.5. Standards in various domains 23<br/><br/>2.2.6. Perspectives 24<br/><br/>2.3. Building of maturity 28<br/><br/>2.4. Confirmation of maturity 30<br/><br/>Chapter 3. Derating Analysis 33<br/><br/>3.1. Derating 33<br/><br/>3.2. Rules provided by the manufacturers of components 34<br/><br/>3.2.1. CMS resistors 34<br/><br/>3.2.2. Capacitors 38<br/><br/>3.2.3. Magnetic circuits 41<br/><br/>3.2.4. Fuses 41<br/><br/>3.2.5. Resonators 42<br/><br/>3.2.6. Oscillators 42<br/><br/>3.2.7. Photocouplers 42<br/><br/>3.2.8. Diodes 43<br/><br/>3.2.9. Zener diodes 43<br/><br/>3.2.10. Tranzorb diodes 43<br/><br/>3.2.11. Low power bipolar transistors 45<br/><br/>3.2.12. Power bipolar transistors 45<br/><br/>3.2.13. Low power MOSFET transistors 46<br/><br/>3.2.14. High power MOSFET transistors 46<br/><br/>3.2.15. Integrated circuits 47<br/><br/>3.3. Reference-based approach 47<br/><br/>3.4. Creation of derating rules 49<br/><br/>3.4.1. Rules for constant temperature 53<br/><br/>3.4.2. Rule for voltage 58<br/><br/>3.5. Summary 59<br/><br/>Chapter 4. Components with Limited Service Life 61<br/><br/>4.1. RDF 2000 guide 63<br/><br/>4.1.1. Power transistor 63<br/><br/>4.1.2. Photocouplers 64<br/><br/>4.1.3. Switch or push button 64<br/><br/>4.1.4. Connectors 65<br/><br/>4.2. FIDES 2009 guide 65<br/><br/>4.2.1. Fans 66<br/><br/>4.2.2. Batteries 66<br/><br/>4.3. Manufacturer’s data 68<br/><br/>4.3.1. Wet electrolytic capacitor 68<br/><br/>4.3.2. Connectors 71<br/><br/>4.3.3. Relays 72<br/><br/>4.3.4. Optocouplers 73<br/><br/>4.3.5. Batteries 76<br/><br/>4.3.6. Fans 77<br/><br/>4.3.7. Flash memories 78<br/><br/>4.3.8. Potentiometers 79<br/><br/>4.3.9. Quartz oscillators 81<br/><br/>4.3.10. Voltage references 81<br/><br/>4.4. Summary of components with limited service life 82<br/><br/>Chapter 5. Analysis of Product Performances 85<br/><br/>5.1. Analyses during the design stage 85<br/><br/>5.1.1. Worst-case analysis 85<br/><br/>5.1.2. Quadratic analysis 88<br/><br/>5.1.3. Monte-Carlo analysis 89<br/><br/>5.1.4. Numerical simulations 91<br/><br/>5.2. Analyses during the manufacturing stage 92<br/><br/>Chapter 6. Aggravated Tests 95<br/><br/>6.1. Definition 95<br/><br/>6.2. Objectives of aggravated tests 95<br/><br/>6.3. Principles of aggravated tests 97<br/><br/>6.3.1. Choice of physical constraints 101<br/><br/>6.3.2. Principle of HALT 101<br/><br/>6.3.3. Specific or additional constraints 106<br/><br/>6.3.4. Number of required samples 106<br/><br/>6.3.5. Operational test, diagnosis and identification of weaknesses 107<br/><br/>6.3.6. Monitoring specification 107<br/><br/>6.3.7. Instrumentation 108<br/><br/>6.3.8. Root cause analysis, corrective actions and breakdown management 108<br/><br/>6.4. Robustness 111<br/><br/>6.4.1. Estimation of robustness margins 111<br/><br/>6.4.2. Sufficient margins 112<br/><br/>Chapter 7. Burn-In Test 117<br/><br/>7.1. Link between HALT and HASS tests 119<br/><br/>7.2. POS1 test 119<br/><br/>7.2.1. Miner’s approach 119<br/><br/>7.2.2. Approach according to the physical laws of failure 121<br/><br/>7.2.3. Zero-failure reliability proof approach 124<br/><br/>7.3. POS2 test 125<br/><br/>7.3.1. Influence of parameter Q 128<br/><br/>7.3.2. Influence of parameter p 129<br/><br/>7.3.3. Summary of the POS2 test 133<br/><br/>7.4. HASS cycle 133<br/><br/>7.4.1. Precipitation stage 133<br/><br/>7.4.2. Detection stage 134<br/><br/>7.5. Should burn-in tests be systematically conducted? 136<br/><br/>7.5.1. Constraints extrinsic to the equipment manufacturer 137<br/><br/>7.5.2. Constraints intrinsic to the equipment manufacturer 137<br/><br/>7.5.3. Decision criteria 137<br/><br/>7.6. Test coverage 142<br/><br/>7.7. Economic aspect of burn-in 144<br/><br/>7.7.1. No burn-in test is conducted 145<br/><br/>7.7.2. Burn-in test is conducted 146<br/><br/>Chapter 8. Run-In 153<br/><br/>8.1. Run-in principle 153<br/><br/>8.2. Stabilization 156<br/><br/>8.2.1. Proposed principle 156<br/><br/>8.2.2. Drift acceleration law 159<br/><br/>8.2.3. Choice of the drift model 161<br/><br/>8.2.4. Equivalent level of physical contribution 162<br/><br/>8.3. Expression of the corresponding degradation 164<br/><br/>8.4. Optimization of the stabilization time 165<br/><br/>8.5. Estimation of a prediction interval of the degradation 167<br/><br/>8.5.1. Principle of the stabilization method 167<br/><br/>List of Notations 171<br/><br/>List of Definitions 173<br/><br/>List of Acronyms 179<br/><br/>References 183<br/><br/>Index 187
520 ## - SUMMARY, ETC.
Summary, etc Every parent is concerned when a child is slow to become a mature adult. This is also true for any product designer, regardless of their industry sector. For a product to be mature, it must have an expected level of reliability from the moment it is put into service, and must maintain this level throughout its industrial use.<br/><br/>While there have been theoretical and practical advances in reliability from the 1960s to the end of the 1990s, to take into account the effect of maintenance, the maturity of a product is often only partially addressed.<br/><br/>Product Maturity 1 fills this gap as much as possible; a difficult exercise given that maturity is a transverse activity in the engineering sciences; it must be present throughout the lifecycle of a product.
545 0# - BIOGRAPHICAL OR HISTORICAL DATA
Biographical or historical note About the Author<br/>Franck Bayle is an electronic engineer by training. He has practiced for almost 15 years, working at Crouzet and then at Thalès in Valence, France. He has also worked in reliability and maturity.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Reliability (Engineering)
Authority record control number http://id.loc.gov/authorities/subjects/sh85112511.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Systems engineering.
Authority record control number http://id.loc.gov/authorities/subjects/sh85131750.
655 #4 - INDEX TERM--GENRE/FORM
Genre/form data or focus term Electronic books.
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title Mechanical engineering and solid mechanics series.
Name of part/section of a work Reliability of multiphysical systems set ;
Volume number/sequential designation v.12.
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier https://onlinelibrary.wiley.com/doi/book/10.1002/9781119902232
Link text Full text available at Wiley Online Library Click here to view
942 ## - ADDED ENTRY ELEMENTS
Source of classification or shelving scheme
Item type EBOOK
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Permanent Location Current Location Date acquired Source of acquisition Full call number Date last seen Price effective from Item type
          COLLEGE LIBRARY COLLEGE LIBRARY 2024-09-12 Megatexts Phil. Inc. 620.00452 B3431 2022 2024-09-12 2024-09-12 EBOOK